SD-103 Hi-Res 2500nm tall spike with 30nm

2500nm tall spike with 30nm end radius and 150nm base width

This series of probes were designed to continue pushing the limits of the Bruker unique FastScan technology that enables biological observations in fluid in a small volume flow-cell in conjunction with heating control

Max Overhang = 30 nm

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtSi Back Side Coating: Reflective Al

SD-103 Hi-Res 2500nm tall spike with 30nmSPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.